|115 Library Dr.|
|Rochester, Michigan 48309|
|Hongwei Qu, Ph.D.|
|Department of Electrical and Computer Engineering|
website updated: Jul. 2017
A JEOL JEM-2100Plus transmission electron microscope (TEM) is on its way to the Advanced Analytical Center located at Suite EC 260. The project is funded by the NSF ECCS program in 2016 under award number ECCS-1625965.
The JEOL 6510/GS scanning electron microscope (SEM) integrated with Oxford Instruments EDS unit was funded by the same NSF ECCS program in 2010. It has been recently relocated to the new Engineering Build, Room 260B.
Traning for relevant faculty, graduate students and external users, can be scheduled with Dr. H. Qu.
Denton Desk V Carbon/gold Coater
If coated with nano particles using this accessary, even insulators can be scanned and imaged by the SEM.
Sample Images Taken by the SEM
Close-up view of a piece of clean room Kleenex with long fibers
The wipe fibers have been coated with carbon nano particles prior to the imaging process.
Micro structures of a metal MEMS device
EDS Spectra of a compound